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https://elar.rsvpu.ru/handle/123456789/28080
Title: | Microwave resistance of metal-dielectric film nanocomposites Co X(SiO2)1-X |
Authors: | Rinkevich, A. B. Perov, D. V. Vaskovsky, V. O. Gorkovenko, A. N. Kuznetsov, E. A. |
Issue Date: | 2010 |
Abstract: | Penetration and reflection of millimeter waveband electromagnetic waves have been studied for thin film metal-dielectric nanocomposite Co X(SiO2)1-X materials, in which cobalt nanoparticles are placed inside of 100nm thickness SiO2 film. Microwave properties of nanocomposite samples with different cobalt content have been measured. Measurements are carried out in frequency range from 26 to 38 GHz. The frequency dependencies of transmission and reflection coefficients are obtained. Share of power loss in the samples was calculated. The algorithm for conductivity reconstruction from the transmission coefficient frequency dependence was worked out. It was found that the microwave conductivity arises with increase of cobalt content and differs essentially from dc conductivity. © 2010 EuMA. |
Keywords: | COBALT CONTENT COBALT NANOPARTICLES DC CONDUCTIVITY FREQUENCY DEPENDENCE FREQUENCY DEPENDENCIES FREQUENCY RANGES METAL-DIELECTRIC FILMS MICROWAVE CONDUCTIVITY MICROWAVE PROPERTY MILLIMETER-WAVE BAND NANOCOMPOSITE SAMPLES POWER-LOSSES THIN FILM METAL TRANSMISSION AND REFLECTION COEFFICIENT TRANSMISSION COEFFICIENTS DC POWER TRANSMISSION DIELECTRIC FILMS ELECTROMAGNETIC WAVES MICROWAVES NANOCOMPOSITES SILICON COMPOUNDS COBALT |
Conference name: | 13th European Microwave Week 2010, EuMW2010: Connecting the World - 40th European Microwave Conference, EuMC 2010 |
Conference date: | 28 September 2010 through 30 September 2010 |
ISBN: | 9782874870163 |
SCOPUS: | 78650055831 |
metadata.dc.description.sponsorship: | European Microwave Association (EuMA);IEEE;MTT-S;Electron Devices Society (EDS);GAAS |
Appears in Collections: | Научные публикации, проиндексированные в SCOPUS и WoS |
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