1. Электронный архив РГППУ
  2. Общеуниверситетские коллекции
  3. Научные публикации, проиндексированные в SCOPUS и WoS
Пожалуйста, используйте этот идентификатор, чтобы цитировать или ссылаться на этот ресурс: https://elar.rsvpu.ru/handle/123456789/40052
Полная запись метаданных
Поле DCЗначениеЯзык
dc.contributor.authorRinkevich, A. B.en
dc.contributor.authorPerov, D. V.en
dc.contributor.authorVaskovsky, V. O.en
dc.contributor.authorGorkovenko, A. N.en
dc.contributor.authorKuznetsov, E. A.en
dc.coverage.spatialRSVPUen
dc.coverage.spatialSCOPUSen
dc.date.accessioned2022-05-20T09:20:11Z-
dc.date.available2022-05-20T09:20:11Z-
dc.date.issued2017-
dc.identifier.issn1536125X-
dc.identifier.otherhttps://www.scopus.com/record/display.uri?origin=resultslist&eid=2-s2.0-85029162630scopus_url
dc.identifier.urihttps://elar.rsvpu.ru/handle/123456789/40052-
dc.description.abstractTransmission and reflection of millimeter waveband electromagnetic waves have been studied for thin-film metaldielectric Cox(SiO2 )1-x and Cox(Al2O3 )1-x nanocomposite materials, where cobalt nanoparticles are placed inside SiO2 or Al2O3 films of 100 nm thickness. Themicrowave properties of the nanocomposite samples with different cobalt content have been measured in the frequency ranges from 26 to 38 GHz and from 53 to 77 GHz. Frequency dependencies of transmission and reflection coefficients have been measured. Power loss in the samples has been determined. An algorithm for recovering the conductivity from the frequency dependencies of the transmission and reflection coefficients has been worked out. It has been found that the microwave conductivity increases with increasing cobalt content and differs drastically from the dc conductivity. The obtained results have been compared to the actual measurements of magnetic properties. © 2017 IEEE.en
dc.description.sponsorshipRussian Foundation for Basic Research, RFBR: 16-32-00327 mol_aen
dc.description.sponsorship Russian Science Foundation, RSF: 17-12-01002rin@imp.uran.ruen
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en
dc.rightsinfo:eu-repo/semantics/restrictedAccessen
dc.sourceIEEE Transactions on Nanotechnologyen
dc.subjectMICROWAVE AND DC CONDUCTIVITYen
dc.subjectMICROWAVE MEASUREMENTen
dc.subjectTHIN-FILM NANOCOMPOSITEen
dc.subjectWAVEGUIDEen
dc.subjectCOBALTen
dc.subjectDIELECTRIC MATERIALSen
dc.subjectELECTRIC CONDUCTIVITYen
dc.subjectELECTROMAGNETIC WAVESen
dc.subjectFILM THICKNESSen
dc.subjectFILMSen
dc.subjectMETAL NANOPARTICLESen
dc.subjectMICROWAVE MEASUREMENTen
dc.subjectMICROWAVESen
dc.subjectMILLIMETER WAVESen
dc.subjectNANOCOMPOSITE FILMSen
dc.subjectNANOCOMPOSITESen
dc.subjectREFLECTIONen
dc.subjectSATURATION MAGNETIZATIONen
dc.subjectWAVEGUIDESen
dc.subjectDC CONDUCTIVITYen
dc.subjectFREQUENCY MEASUREMENTSen
dc.subjectMAGNETIC TUNNELINGen
dc.subjectMICROWAVE THEORY AND TECHNIQUESen
dc.subjectTHIN-FILM NANOCOMPOSITESen
dc.subjectTHIN FILMSen
dc.titleMillimeter wave resistance of metal-dielectric Cox(SiO2)1-x and Cox(Al2O3)1-x filmsen
dc.typeArticleen
dc.typeinfo:eu-repo/semantics/articleen
dc.typeinfo:eu-repo/semantics/publishedVersionen
dcterms.audienceOtheren
dcterms.audienceParents and Familiesen
dcterms.audienceResearchersen
dcterms.audienceSchool Support Staffen
dcterms.audienceStudentsen
dcterms.audienceTeachersen
local.description.firstpage1067-
local.description.lastpage1072-
local.issue6-
local.volume16-
local.identifier.doi10.1109/TNANO.2017.2748344-
local.identifier.scopus85029162630-
local.identifier.eid2-s2.0-85029162630-
local.identifier.affiliationM. N. Miheev Institute of Metal Physics, Ural Branch of Russian Academy of Science, Ekaterinburg, 620990, Russian Federationen
local.identifier.affiliationUral Federal University, Ekaterinburg, 620083, Russian Federationen
local.identifier.affiliationState Social Pedagogical Academy, Nizhny Tagil, 622031, Russian Federationen
local.identifier.sourceScopusen
local.identifier.otherhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85029162630&doi=10.1109%2fTNANO.2017.2748344&partnerID=40&md5=8dfa90ab541367643b0e72826d7cbcbb
local.description.order8023889-
local.contributor.employeeRinkevich, A.B., M. N. Miheev Institute of Metal Physics, Ural Branch of Russian Academy of Science, Ekaterinburg, 620990, Russian Federation
local.contributor.employeePerov, D.V., M. N. Miheev Institute of Metal Physics, Ural Branch of Russian Academy of Science, Ekaterinburg, 620990, Russian Federation
local.contributor.employeeVaskovsky, V.O., Ural Federal University, Ekaterinburg, 620083, Russian Federation
local.contributor.employeeGorkovenko, A.N., Ural Federal University, Ekaterinburg, 620083, Russian Federation
local.contributor.employeeKuznetsov, E.A., State Social Pedagogical Academy, Nizhny Tagil, 622031, Russian Federation
Располагается в коллекциях:Научные публикации, проиндексированные в SCOPUS и WoS

Файлы этого ресурса:
Файл Описание РазмерФормат 
2-s2.0-85029162630.pdf855,8 kBAdobe PDFПросмотреть/Открыть
Показать базовое описание ресурса Статистика  Google Scholar 



Все ресурсы в архиве электронных ресурсов защищены авторским правом, все права сохранены.