Please use this identifier to cite or link to this item:
https://elar.rsvpu.ru/handle/123456789/40052
Title: | Millimeter wave resistance of metal-dielectric Cox(SiO2)1-x and Cox(Al2O3)1-x films |
Authors: | Rinkevich, A. B. Perov, D. V. Vaskovsky, V. O. Gorkovenko, A. N. Kuznetsov, E. A. |
Issue Date: | 2017 |
Publisher: | Institute of Electrical and Electronics Engineers Inc. |
Abstract: | Transmission and reflection of millimeter waveband electromagnetic waves have been studied for thin-film metaldielectric Cox(SiO2 )1-x and Cox(Al2O3 )1-x nanocomposite materials, where cobalt nanoparticles are placed inside SiO2 or Al2O3 films of 100 nm thickness. Themicrowave properties of the nanocomposite samples with different cobalt content have been measured in the frequency ranges from 26 to 38 GHz and from 53 to 77 GHz. Frequency dependencies of transmission and reflection coefficients have been measured. Power loss in the samples has been determined. An algorithm for recovering the conductivity from the frequency dependencies of the transmission and reflection coefficients has been worked out. It has been found that the microwave conductivity increases with increasing cobalt content and differs drastically from the dc conductivity. The obtained results have been compared to the actual measurements of magnetic properties. © 2017 IEEE. |
Keywords: | MICROWAVE AND DC CONDUCTIVITY MICROWAVE MEASUREMENT THIN-FILM NANOCOMPOSITE WAVEGUIDE COBALT DIELECTRIC MATERIALS ELECTRIC CONDUCTIVITY ELECTROMAGNETIC WAVES FILM THICKNESS FILMS METAL NANOPARTICLES MICROWAVE MEASUREMENT MICROWAVES MILLIMETER WAVES NANOCOMPOSITE FILMS NANOCOMPOSITES REFLECTION SATURATION MAGNETIZATION WAVEGUIDES DC CONDUCTIVITY FREQUENCY MEASUREMENTS MAGNETIC TUNNELING MICROWAVE THEORY AND TECHNIQUES THIN-FILM NANOCOMPOSITES THIN FILMS |
ISSN: | 1536125X |
DOI: | 10.1109/TNANO.2017.2748344 |
SCOPUS: | 85029162630 |
metadata.dc.description.sponsorship: | Russian Foundation for Basic Research, RFBR: 16-32-00327 mol_a Russian Science Foundation, RSF: 17-12-01002rin@imp.uran.ru |
Appears in Collections: | Научные публикации, проиндексированные в SCOPUS и WoS |
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